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Statistical model of program/verify algorithms in resistive-switching memories for in-memory neural network accelerators
Glukhov, A.; Milo, V.; Baroni, A.; Lepri, N.; Zambelli, C.; Olivo, P.; Perez, E.; Wenger, C.; Ielmini, D.
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Institute of Electrical and Electronics Engineers Inc.,
IEEE International Reliability Physics Symposium Proceedings
Vol. 2022-, No. 1, pp: 31-37, Anno: 2022 |
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End-to-end modeling of variability-aware neural networks based on resistive-switching memory arrays
Glukhov, A; Lepri, N; Milo, V; Baroni, A; Zambelli, C; Olivo, P; Perez, E; Wenger, C; Ielmini, D
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IEEE Computer Society,
IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
pp: 1-5, Anno: 2022 |
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Experimental verification and benchmark of in-memory principal component analysis by crosspoint arrays of resistive switching memory
Mannocci, P.; Baroni, A.; Melacarne, E.; Zambelli, C.; Olivo, P.; Perez, E.; Wenger, C.; Ielmini, D.
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Institute of Electrical and Electronics Engineers Inc.,
Proceedings - IEEE International Symposium on Circuits and Systems
Vol. 2022, No. 1, pp: 326-330, Anno: 2022 |
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Optimized programming algorithms for multilevel RRAM in hardware neural networks
Milo, V.; Anzalone, F.; Zambelli, C.; Perez, E.; Mahadevaiah, M. K.; Ossorio, O. G.; Olivo, P.; Wenger, C.; Ielmini, D.
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Institute of Electrical and Electronics Engineers Inc.,
IEEE International Reliability Physics Symposium Proceedings
Vol. 2021, No. 1, pp: 1-6, Anno: 2021 |
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Reliability challenges in 3D NAND Flash memories
Zambelli, C.; Micheloni, R.; Olivo, P.
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Institute of Electrical and Electronics Engineers Inc.,
2019 IEEE 11th International Memory Workshop, IMW 2019
pp: 1-8739741-4, Anno: 2019 |
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Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing
Mahadevaiah, M. K.; Perez, E.; Wenger, C.; Grossi, A.; Zambelli, C.; Olivo, P.; Zahari, F.; Kohlstedt, H.; Ziegler, M.
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Institute of Electrical and Electronics Engineers Inc.,
IEEE International Reliability Physics Symposium Proceedings
Vol. 2019, No. March, pp: 8720552-1-8720552-4, Anno: 2019 |
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Low-energy inference machine with multilevel HfO2 RRAM arrays
Milo, V.; Zambelli, C.; Olivo, P.; Perez, E.; Ossorio, O. G.; Wenger, C.; Ielmini, D.
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IEEE,
European Solid-State Device Research Conference
Vol. 2019, No. 1, pp: 174-177, Anno: 2019 |
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Dynamic VTH Tracking for Cross-Temperature Suppression in 3D-TLC NAND Flash
Zambelli, C.; Ferro, E.; Crippa, L.; Micheloni, R.; Olivo, P.
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Institute of Electrical and Electronics Engineers Inc.,
2019 IEEE International Integrated Reliability Workshop (IIRW)
Vol. 2019, No. 1, pp: 8989886-1-8989886-4, Anno: 2019 |
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Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories
Zambelli, Cristian; Crippa, Luca; Micheloni, Rino; Olivo, Piero
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IEEE,
2018 International Integrated Reliability Workshop (IIRW)
Vol. 2018-, No. 1, pp: 44-47, Anno: 2018 |
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Temperature impact and programming algorithm for RRAM based memories
Pérez, E.; Grossi, A.; Zambelli, C.; Mahadevaiah, M. K.; Olivo, P.; Wenger, Ch.
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Institute of Electrical and Electronics Engineers Inc.,
2018 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IMWS-AMP 2018
pp: 1-3, Anno: 2018 |
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Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs
Zambelli, Cristian; Castellari, Marco; Olivo, Piero; Bertozzi, Davide
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IEEE,
2018 New Generation of CAS (NGCAS)
pp: 21-24, Anno: 2018 |
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The role of the bottom and top interfaces in the 1st reset operation in HfO2 based RRAM devices
Perez, Eduardo; Mahadevaiah, Mamathamba Kalishettyhalli; Wenger, Christian; Zambelli, Cristian; Olivo, Piero
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IEEE,
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
pp: 37-40, Anno: 2018 |
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Limits of sensing and storage electronic components for high-reliable and safety-critical automotive applications
Pieri, Francesco; Zambelli, Cristian; Nannini, Andrea; Olivo, Piero; Saponara, Sergio
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IEEE,
Electrical and Electronic Technologies for Automotive, 2017 International Conference of
pp: 1-7, Anno: 2017 |
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Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization
Zambelli, Cristian; Cancelliere, Giuseppe; Riguzzi, Fabrizio; Lamma, Evelina; Olivo, Piero; Marelli, Alessia; Micheloni, Rino
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IEEE,
Memory Workshop (IMW), 2017 IEEE International
pp: 1-4, Anno: 2017 |
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Uniform and concentrated read disturb effects in mid-1X TLC NAND flash memories for enterprise solid state drives
Zambelli, Cristian; Olivo, Piero; Crippa, Luca; Marelli, Alessia; Micheloni, Rino
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IEEE,
Reliability Physics Symposium (IRPS),2017 IEEE International
pp: PM-5.1-PM-5.4, Anno: 2017 |
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Memory System Architecture Optimization for Enterprise All-RRAM Solid State Drives
Zuolo, Lorenzo; Zambelli, Cristian; Grossi, Alessandro; Micheloni, Rino; Bates, Stephen; Olivo, Piero
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IEEE,
2016 IEEE 8th International Memory Workshop (IMW)
pp: 1-4, Anno: 2016 |
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Power-supply impact on the reliability of mid-1X TLC NAND flash memories
Zambelli, Cristian; King, Pietro; Olivo, Piero; Crippa, Luca; Micheloni, Rino
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IEEE,
Reliability Physics Symposium (IRPS), 2016 IEEE International
pp: 2B-3-1-2B-3-6, Anno: 2016 |
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Fundamental variability limits of filament-based RRAM
Grossi, Alessandro; Nowak, E.; Zambelli, Cristian; Pellissier, C.; Bernasconi, S.; Cibrario, G.; Hajjam, K. El; Crochemore, R.; Nodin, J. F.; Olivo, Piero; Perniola, L.
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IEEE,
Electron Devices Meeting (IEDM), 2016 IEEE International
pp: 4.7.1-4.7.4, Anno: 2016 |
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Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2
Grossi, Alessandro; Perez, Eduardo; Zambelli, Cristian; Olivo, Piero; Wenger, Christian
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IEEE,
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
pp: 80-83, Anno: 2016 |
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Reliability and Cell-to-Cell Variability of TAS-MRAM arrays under cycling conditions
Grossi, Alessandro; Zambelli, Cristian; Olivo, Piero; Alvarez Herault, Jeremy; Mackay, Ken
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Institute of Electrical and Electronics Engineers Inc.,
2015 15th Non-Volatile Memory Technology Symposium (NVMTS)
Vol. 2015-, No. 1, pp: 1-4, Anno: 2015 |
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